Philips' Gloeilampenfabrieken, Eindhoven) ISBN 1-87 Edington (1976) Practical electron microscopy in materials science (N. Cowley (1975) Diffraction Physics (North-Holland, Amsterdam). Thorne and John Archibald Wheeler (1973) Gravitation (W. Warren (1969) X-ray diffraction (Addison-Wesley, paperback edition by Dover Books 1990) ISBN 7-5. Nuffield (1966) X-ray diffraction methods (John Wiley, NY). ^ Zbigniew Dauter and Mariusz Jaskolski (2010) "How to read (and understand) Volume A of International Tables for Crystallography: an introduction for nonspecialists", J.This diffraction pattern is characteristic of the crystal structure and orientation of the sample at. Ziman (1972 2nd ed) Principles of the theory of solids (Cambridge U. The diffracted electrons produce a unique pattern. ^ George Arfken (1970) Mathematical methods for physicists (Academic Press, New York).Because of their small wavelength λ, high energy electrons used in electron microscopes have a very large Ewald sphere radius (1/λ), so that electron diffraction generally "lights up" diffraction spots with g-vectors ( hkl) that are perpendicular to. of electrons, X-rays or neutrons traveling along a lattice direction specified by the zone-axis indices. This is true even if, as is often the case, the basis vector set used to describe the lattice is not Cartesian.īy extension, a zone-axis pattern (ZAP) is a diffraction pattern taken with an incident beam, e.g. Direct lattice vectors have components measured in distance units, like meters (m) or angstroms (Å).Ī lattice vector is indexed by its coordinates in the direct lattice basis system. the magnitudes of the vectors, called a, b and c, and the angles between them, called α (between b and c), β (between c and a), and γ (between a and b). The translational invariance of a crystal lattice is described by a set of unit cell, direct lattice basis vectors ( contravariant or polar) called a, b, and c, or equivalently by the lattice parameters, i.e.
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